J-FAB: Jon’s Film Analysis for Buried Layers
(Download located on public Google Drive folder)
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Credits
The interface portions of J-FAB and modules were developed by Jonathan Church at the University of Delaware. Special credit also belongs to Conan Weiland at Synchrotron Research, Inc for establishing the framework of a Bayesian search algorithm, and the functions deployed within the search algorithm to manipulate x-ray photoemission spectroscopy data. This software is being provided “as-is” and both the respective developers and owners disclaim all liability whatsoever in its use
License
J-FAB is Open Source (http://opensource.org/) software.
You are free to use, modify, and redistribute the source code and documentation. There is no charge for their use. The main limitations are that you cannot claim you wrote the program or documentation and cannot prevent other people from using them.
The source code and documentation are copyrighted and distributed under the terms of the following license:
Copyright (c) 2015 Jonathan Church, University of Delaware
Permission to use and redistribute the source code or binary forms of this software and its documentation, with or without modification is hereby granted provided that the above notice of copyright, these terms of use, and the disclaimer of warranty below appear in the source code and documentation, and that none of the names of the University of Delaware or the authors appear in advertising or endorsement of works derived from this software without specific prior written permission from all parties.
THE SOFTWARE IS PROVIDED “AS IS”, WITHOUT WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THIS SOFTWARE.