Our Bruker Senterra microscope is fully automated for two-dimensional mapping with either internal 532 nm or 785 nm source. Incorporated in the Raman microscope is a Nanonics MV2000 fiber optic AFM. This enables simultaneous AFM-Raman and AFM-TERS imaging.
Facility fees to defray instrumentation maintenance costs are $12/hour for the Bruker Senterra. Please consider including this in your next proposal.
Additionally, the group is equipped with Raman probes for in-situ analysis.
The Bruker Hyperion IR microscope and affiliated Vertex FT-IR has both near-IR and mid-IR capabilities.
Facility fees to defray instrumentation maintenance costs are $6/hour for the Bruker Hyperion IR / Vertex FT-IR. Please consider including this in your next proposal.
The FT-IR’s vertex is also capable of multi-angle SPR measurements from 0.8 to 10 microns.
DC Magnetron Sputter
We have two Cressington sputter coaters. The 308 is a multihead sputterer and the 208 is a single head. We also have a plasma etcher for cleaning samples before or after sputtering.
For use of any instrument, please contact Dr. Booksh at email@example.com