Consulting and Services are available in a number of areas including :
- X-ray Photoelectron Spectroscopy (XPS or ESCA)
- Time-of-Flight Secondary-Ion Mass Spectrometry (TOF-SIMS)
- X-ray Photoelectron Imaging
- Auger Electron Spectroscopy (AES)
- Scanning Auger Microscopy or Imaging (SAM)
- Secondary-Electron Microscopy (SEM)
- Ion-Scattering Spectroscopy (ISS or LEIS)
- Scanning Probe Microscopy (STM and AFM)
The Facility charges a fee for services in accordance with NSF guidelines and University policies.
The NSF has partially funded this facility (CMS-9413498; DMR-9724307). NSF “encourages the sharing of instrumentation – both among academic institutions and, when appropriate, among the academic, industrial and public sectors.” These collaborations make available new and unique instrumentation which would not otherwise be available, thereby benefiting the company, the university and the economy; they “strengthen scientific research potential of the Nation.” But despite the NSF’s “preference for sharing of instrumentation, it is contrary to the NSF’s intent for grantees to use NSF-supported research instrumentation or facilities to provide services for a fee in direct competition with private companies that provide equivalent services.” NSF guidelines are available (NSF Important Notice 91).
We also encourage for-profit surface analysis laboratories to contact us directly regarding their concerns about unfair competition. We would be happy to pass along information about your company to interested parties that inquire of our facility.