The University of Delaware’s research community includes many research groups that make use of experimental surface analysis in their research. These research groups come from several departments in two colleges. In 1995 the Surface Analysis Facility was established by Tom Beebe at the University of Utah in the Chemistry Department through funding by the National Science Foundation (NSF). In September of 2001, this facility was moved to the University of Delaware, where it is managed by Tom Beebe.
MISSION OF THE FACILITY
The Surface Analysis Facility exists primarily to support the federally funded research projects of University of Delaware faculty members, and it has been subsidized from University sources to do so. To help defray operating costs, the Facility also welcomes, and the NSF encourages, collaborative interactions with other universities and colleges, as well as local, regional and national for-profit companies. The Facility charges a fee for services in accordance with NSF guidelines and University policies (see later section NSF Guidelines for Sharing of Instrumentation).
Consulting and Services in:
- X-ray Photoelectron Spectroscopy (XPS or ESCA)
- Time-of-Flight Secondary-Ion Mass Spectrometry (TOF-SIMS)
- X-ray Photoelectron Imaging
- Auger Electron Spectroscopy (AES)
- Scanning Auger Microscopy or Imaging (SAM)
- Secondary-Electron Microscopy (SEM)
- Ion-Scattering Spectroscopy (ISS or LEIS)
- Scanning Probe Microscopy (STM and AFM)